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KMID : 0545120090190060547
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Journal of Microbiology and Biotechnology
2009 Volume.19 No. 6 p.547 ~ p.555
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Nanoscopic Morphological Changes in Yeast Cell Surfaces Caused by Oxidative Stress: An Atomic Force Microscopic Study
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Canetta Elisabetta
Walker Graeme M.
Adya Ashok K.
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Abstract
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Nanoscopic changes in the cell surface morphology of the yeasts Saccharomyces cerevisiae (strain NCYC 1681) and Schizosaccharomyces pombe (strain DVPB 1354), due to their exposure to varying concentrations of hydrogen peroxide (oxidative stress), were investigated using an atomic force microscope (AFM). Increasing hydrogen peroxide concentration led to a decrease in cell viabilities and mean cell volumes, and an increase in the surface roughness of the yeasts. In addition, AFM studies revealed that oxidative stress caused cell compression in both S. cerevisiae and Schiz. pombe cells and an increase in the number of aged yeasts. These results confirmed the importance and usefulness of AFM in investigating the morphology of stressed microbial cells at the nanoscale. The results also provided novel information on the relative oxidative stress tolerance of S. cerevisiae and Schiz. pombe.
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KEYWORD
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Atomic force microscopy (AFM), yeast morphology, yeasts physiology, oxidative stress, Saccharomyces cerevisiae, Schizosaccharomyces pombe, premature ageing of cells
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